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Mr. Michael Shifrin is a seasoned semiconductor metrology professional with over 15 years of experience in the field. In the past five years, Mr. Shifrin has been holding various positions in the Dimensional Metrology, Advanced Modeling R&D and Product Management divisions of Nova Measuring Instruments, Inc. In his current role, he is responsible for setting advanced modeling product roadmaps and requirements for addressing advanced metrology challenges. He is also responsible for proliferating solutions to the HVM sites and R&D centers.
Prior to joining Nova Measuring Instruments Inc., Mr. Shifrin had worked with leading memory and logic semiconductor manufacturing companies, managing the overall metrology solutions for production and process R&D for over a decade.
Mr. Shifrin holds a BSc degree in Mechanical Engineering from Ben Gurion University of the Negev and an MSc degree in Materials and Nanoscience from Tel Aviv University.
Mr. Shifrin is an author of several patents and publications and winner of the 2018 SPIE Best Metrology Paper Award.
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