|
Kristof Croes has an MSc in physics and an MSc in biostatistics. Also, he obtained a PhD dealing with the development of statistical techniques for planning reliability experiments. After this PhD, he joined the reliability business unit of XPEQT, first as the software responsible and than as the manager of the R&D. From 2003 till end 2006, he was product and application manager of the package level reliability products of the Singaporean based company Chiron holdings. Beginning 2007, he went back to research, working as a BEOL reliability engineer in imec. Currently, he is group leader of the Reliability, Electrical test and Modeling group working on test, characterization (electrical, thermal and (thermo)-mechanical) and reliability with main focus on advanced interconnects (2D, 3D, OIO). Kristof was an (invited/tutorial) speaker at several leading egde semi-conductor conferences (IRPS, IITC, IEDM, ...). He also (co)-authored >100 papers in the field of reliability.
|
