** to designate keynote talk Sponsored by:  
* to designate invite talk
   

Sunday, March 14, 2021 Shanghai International Convention Center
Meeting Room: 5B+5C

Session I: 3D and Advanced Packaging Technologies
Session Chair: Renzhe Zhao
*13:30–13:55 TSV and Hybrid Bonding Solutions for 3D Heterogeneous Integration Packaging Applying in next AI / HPC Era
  Albert Lan, Applied Materials
*13:55-14:20 The Development of 3D IPDs on Glass Wafer
  Daquan Yu, Xiamen University
14:20–14:35 Research on the Improvement of SI Performance of High Bandwidth Memory Interface by New 2.5D Silicon Interposer Structure
  Chen Xiaolang, Sanechips Technology Co.,Ltd.
14:35–14:50 Innovative PVD Technology Solutions for Advanced Substrate, Backside Metal and EMI Shielding
  Jeff Turner, Applied Materials
14:50–15:05 Next Generation High Performance, Six-pack Double Side Cooled IGBT Power Module for EV/HEV Applications
  Yaqing Ma, Zhuzhou CrrcTimes Electric UK Innovation Center
15:05–15:25 Coffee Break
   

Session II: Packaging Equipment and Process
Session Chair: Renzhe Zhao
*15:25–15:50 Opportunities and Challenges of Wet Process Tools for Wafer Level Package Mmanufacturing Driven by 3D Technology
  David Wang, ACM
15:50–16:05 Important Considerations of Selecting Wafer/Panel-level Die Pick & Place Tool For High Volume Manufacturing
  Nelson Fan, ASM Pacific Technology Ltd.
16:05–16:20 Ashing Process on Warpage Wafer with Low Damage
  Zihan Dong, NAURA, Beijing
16:20–16:35 Numerical Study on the Effect of Graphene Sheet Alignment on Thermal Conductance of Graphene Form
  Yan Zhang, Shanghai University
   

Monday, March 15, 2021 Shanghai International Convention Center
Meeting Room: 5B+5C


Session III: Advanced Packaging Process
Session Chair: Xing Wu
*08:45-09:10 Challenges and Oppotunities of Wide Bandgap Power Devices Packaging & Integration Technology
  Laili Wang, School of Electronical Engineering, Xi'an Jiaotong University
09:10-09:25 TTV Controlling and Optimization Technology for Wafer Ultra-precision Grinding Thinning Process
  Yuanhang Liu, Tsinghua University
09:25–09:40 Conformal Coating Process Optimization for Limiting Bubbles Formation
  Rexel Macaraya, Integrated Micro-Electronics Inc.
09:40–09:55 Electrochemical Migration (ECM) Prevention in Gate to Source of MOSFETs of Insulated Metal Substrate PCB Assembly
  Rexel Macaraya, Integrated Micro-Electronics Inc.
09:55–10:15 Coffee Break
   

Session IV: Inspection, Test and Reliable
Session Chair: Xing Wu
*10:15-10:40 Bonding and Inspection Solution for Advanced IC Packaging
  Chien Kuo, LiZhu Semiconductor
*10:40-11:05 New Frontier in Advanced Packaging Inspection Systems
  Song Zhang, SKYVERSE
*11:05-11:30 Active temperature Control Technology Solution for Emerging Tri-temp Test Applications
  Xiao Han, Hangzhou Changzhuan Technology
11:30-11:45 First Pass Yield Gain Strategies during Tri-Temperature Automotive Package Test
  Jerry Broz, International Test Solutions
11:45-12:00 Research on the Thermal Reliability of Multi-unit PIM
  Juan Hu, Huangshan University
12:00-13:30 Lunch Break

Session V: Noval Packaging Materials and Process
Session Chair: Daquan Yu
*13:30–13:55 Temporary Bonding/Debonding Materials for Advanced Packaging

Guoping Zhang, Shenzhen Institute of Advanced Electronics Materials
13:55–14:10 A Study Of Thermal Interface Materials With Different Thermal Conductivity For HFCBGA Package

Feng Wang, ZTE Corporation
14:10–14:25 A Novel Multifunctional Single-Layer Adhesive Used for both Temporary Bonding and Mechanical Debonding in Wafer-Level Packaging Applications

Wenkai Cheng, Brewer Science, Inc
14:25–14:45 Coffee Break
Poster Session: Location: 5th Floor
Coffee Break Research on the design and fabrication of aluminum nitride microwave multilayer ceramic package
  Zhen-tao Yang, The 13th Research Institute, China Electronics Technology Group Corporation
  A Micro Soldering Method to Improve Strength Between Bonding Pad and Wire
  Li He, Microsystem & Terahertz Research Center, China Academy of Engineering Physics (CAEP)
  Effect of Bi content on the microstructure and mechanical properties of Cu/Sn-Bi/Cu solder joints after soldering and aging
  Mingliang Huang, Dalian University of Technology
  The effect of resin type on the performance of epoxy molding compound
  Hongjie Liu, Jiangsu HHCK advanced materials Co., Ltd.
  Research on Lap Welding manner of Laser Seal Welding Technology of the Common Microwave Module Package Materials
  Na Li, The 13th Research Institute, China Electronics Technology Group Corporation