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Tianming Ni received the Ph.D. degree in integrated circuits and systems from Hefei University of Technology, Hefei, China, in 2018. He is currently an Associate Professor with the College of Electrical Engineering, Anhui Polytechnic University, Wuhu, China, where he established the Institute of Integrated Circuit and System (IICS). Dr. Ni's research interest includes VLSI testing, design for reliability, fault tolerance, 3D-IC TSV tolerant design, machine learning for IC testing, and so on. Dr. Ni has authored/coauthored over 30 papers in refereed journals and conferences, including IEEE TC, TCAD, TVLSI, TCASI, TCASII, TETC, DAC, ATS, etc. He was the recipient of the CCF-Tencent“rhinobird” creativity award fund in 2020, the Best Paper Award from the China Test Conference in 2020, and the Best Paper Award from the China Fault Tolerance Conference in 2017.
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